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Part No: 02-54037-12
This Omron Z4LC-C28 is used untested surplus
Model No: F352085-1
FEI Company XL 830 DualBeam FIB-SEM Focused Ion Beam-Scanning Electron Microscope System
Inventory # G8037
JEOL AP002210(00) Processor PCB Card FE CANSEL PB JSM-6300F SEM Working Surplus Part No: 02-54037-12JEOL AP002210(00) Processor PCB Card FE CANSEL PB JSM 6300F SEM Working Surplus Inventory # CONO 380,21156 Part No: AP002210(00) Model No: FE CANSEL PB Removed from a JEOL JSM 6300F SEM Scanning Electron Microscope System This JEOL AP002210(00) Processor PCB Card FE CANSEL PB is used working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty Estimated
